DocumentCode :
1722881
Title :
A new water treeing model
Author :
Crine, Jean-Pierre ; Jow, Jioder
Author_Institution :
Consultant, Candiac, QC, Canada
Volume :
1
fYear :
2004
Firstpage :
391
Abstract :
A new model for water treeing in polyethylene is introduced. It assumes that when the field-induced stress applied on nano-cavities filled with a liquid is larger than the yield strength of the polymer, bonds will be broken and the nanocavity will expand. The growth of the water trees is enhanced by the fatigue induced by the alternating electric field . This is supported by the fact that all published water-tree length results (whatever the field, frequency or solution) vary linearly with the number of field cycles when plotted on a log-log scale. The diffusion of the liquid is also a parameter affecting the water-tree length and it is included in our model. A simple equation relating the water-tree length with field, time, frequency, and the nature of the solution is presented. A very good agreement between theory and experiments for a wide variety of results obtained with LDPE tested under various fields, frequencies and ionic solutions is observed. This model also predicts the growth of water trees under dc fields after very long times or after many polarity reversals.
Keywords :
bonds (chemical); diffusion; fatigue; nanostructured materials; polymers; trees (electrical); yield strength; yield stress; alternating electric field-induced fatigue; bond breaking; dc fields; field-induced stress; ionic solutions; liquid diffusion; liquid-filled nanocavities; log-log scale; polarity reversals; polyethylene; polymer yield strength; water treeing model; Chemicals; Electronic mail; Fatigue; Frequency; Oxidation; Polyethylene; Polymers; Stress; Temperature; Trees - insulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8348-6
Type :
conf
DOI :
10.1109/ICSD.2004.1350373
Filename :
1350373
Link To Document :
بازگشت