DocumentCode
1723758
Title
Code Coverage Analysis using High-Level Decision Diagrams
Author
Raik, Jaan ; Reinsalu, Uljana ; Ubar, Raimund ; Jenihhin, Maksim ; Ellervee, Peeter
Author_Institution
Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn
fYear
2008
Firstpage
1
Lastpage
6
Abstract
The paper proposes a novel method of analyzing code coverage metrics on a system representation called high-level decision diagrams (HLDD). Previous works have shown that HLDDs are an efficient model for simulation and test pattern generation. Current paper presents a technique, where fast HLDD based simulation is extended to support seamless code coverage analysis. We show how classical code coverage metrics can be directly mapped to HLDD constructs. In addition, we introduce an observability coverage calculation method using HLDD models. Experiments on ITC99 benchmark circuits indicate the feasibility of the proposed approach.
Keywords
decision diagrams; integrated circuit design; ITC99 benchmark circuits; code coverage analysis; high-level decision diagrams; test pattern generation; Analytical models; Computational modeling; Computer simulation; Design engineering; Integrated circuit measurements; Observability; Pattern analysis; Process design; Software testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on
Conference_Location
Bratislava
Print_ISBN
978-1-4244-2276-0
Electronic_ISBN
978-1-4244-2277-7
Type
conf
DOI
10.1109/DDECS.2008.4538786
Filename
4538786
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