Title :
Code Coverage Analysis using High-Level Decision Diagrams
Author :
Raik, Jaan ; Reinsalu, Uljana ; Ubar, Raimund ; Jenihhin, Maksim ; Ellervee, Peeter
Author_Institution :
Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn
Abstract :
The paper proposes a novel method of analyzing code coverage metrics on a system representation called high-level decision diagrams (HLDD). Previous works have shown that HLDDs are an efficient model for simulation and test pattern generation. Current paper presents a technique, where fast HLDD based simulation is extended to support seamless code coverage analysis. We show how classical code coverage metrics can be directly mapped to HLDD constructs. In addition, we introduce an observability coverage calculation method using HLDD models. Experiments on ITC99 benchmark circuits indicate the feasibility of the proposed approach.
Keywords :
decision diagrams; integrated circuit design; ITC99 benchmark circuits; code coverage analysis; high-level decision diagrams; test pattern generation; Analytical models; Computational modeling; Computer simulation; Design engineering; Integrated circuit measurements; Observability; Pattern analysis; Process design; Software testing; Test pattern generators;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on
Conference_Location :
Bratislava
Print_ISBN :
978-1-4244-2276-0
Electronic_ISBN :
978-1-4244-2277-7
DOI :
10.1109/DDECS.2008.4538786