A Test Generating Algorithm of Sequential Circuits Based on State Forecasts

The paper based on descriptive model of sequential circuit´s equation groups provides the algorithm by putting state forecasting techniques into the generation algorithm of test vector. First, carry out the process of fault propagation based on Boolean logic equation groups according to specific fault. And this procedure will be simplified to some degree by using new function model of fault propagation and state forecasting techniques proposed in this paper. Second, by taking continuous iteration of figuring out the logical equation group to fulfill the procedure of fault injection serve to make state jump become directional, which reduces lots of computations. Hence, this proposed algorithm does have significant performance exaltation supported by the results of experiments to indicate the feasibility and high efficiency of this algorithm.