DocumentCode :
172393
Title :
Detecting collusive cheating in online shopping systems through characteristics of social networks
Author :
Jianwei Niu ; Lei Wang ; Yixin Chen ; Wenbo He
Author_Institution :
State Key Lab. of Virtual Reality Technol. & Syst., Beihang Univ., Beijing, China
fYear :
2014
fDate :
April 27 2014-May 2 2014
Firstpage :
311
Lastpage :
316
Abstract :
Detecting the collaborative cheating in an online shopping system is an important but challenging issue. In this paper, we propose a novel approach to detect the collusive manipulation on ratings in Amazon, an online shopping system. Rather than focusing on rating values, we believe the online shopping and rating activities have nontrivial attributes in terms of social network connections. Our major contributions include: (a) We build a virtual social network based on users´ ratings and comments, and detect the collusive cheating based on the social network activities. (b) We investigate the properties of disconnected components in a wide range of social networks, such as the longevity and final size of the disconnected components before they join the giant connected component or merge with other disconnected components. (c) We apply our proposed collusion detection algorithm to detect the possible collusive cheating on the ratings based on the data we crawl from Amazon, and the experimental results validate our approach.
Keywords :
Internet; retail data processing; security of data; social networking (online); Amazon; collaborative cheating detection; collusion detection algorithm; collusive cheating detection; collusive manipulation; online shopping rating activities; online shopping systems; social network activities; social network characteristics; social network connections; user comments; user ratings; virtual social network; Conferences; Detection algorithms; Electronic publishing; Encyclopedias; Internet; Social network services;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Communications Workshops (INFOCOM WKSHPS), 2014 IEEE Conference on
Conference_Location :
Toronto, ON
Type :
conf
DOI :
10.1109/INFCOMW.2014.6849250
Filename :
6849250
Link To Document :
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