• DocumentCode
    1724040
  • Title

    Built-In Current Monitor for IDDQ Testing in CMOS 90 nm Technology

  • Author

    Beresinski, M.J. ; Borejko, T. ; Pleskacz, Witold A. ; Stopjaková, Viera

  • Author_Institution
    Inst. of Microelectron. & Optoelectron., Warsaw Univ. of Technol., Warsaw
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, a built-in current (BIC) monitor for testing low-voltage digital CMOS circuits is presented. The monitor is designated for typical IDDQ testing as well as for characterization of supply current values for different test vectors. Voltage drop across the monitor during measurement and the switching phase are minimized. A wide range of currents is supported. Abilities and limitations of the BIC monitor were verified through simulations. Results of post layout simulations are presented as well. The design was implemented in UMC CMOS 90 nm technology.
  • Keywords
    CMOS digital integrated circuits; integrated circuit testing; current monitor; digital CMOS circuits; testing; CMOS logic circuits; CMOS technology; Circuit faults; Circuit simulation; Circuit testing; Current supplies; Logic testing; Microelectronics; Monitoring; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on
  • Conference_Location
    Bratislava
  • Print_ISBN
    978-1-4244-2276-0
  • Electronic_ISBN
    978-1-4244-2277-7
  • Type

    conf

  • DOI
    10.1109/DDECS.2008.4538797
  • Filename
    4538797
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1724040