Title :
Rectification of near-field images
Author :
Gaikovich, K.P. ; Dryakhlushin, V.F. ; Nozdrin, Yu.N. ; Reznik, A.N. ; Vaks, V.L. ; Zhilin, A.V.
Author_Institution :
Inst. for Phys. of Microstructures, Acad. of Sci., Nizhny Novgorod, Russia
fDate :
6/24/1905 12:00:00 AM
Abstract :
Significant enhancement of resolution in the scanning near-field optical microscopy (SNOM) and in microwave subsurface imaging is achieved by deconvolution of measured 2-D distributions using Tikhonov´s method. This method makes it possible to obtain much better sharpness of images.
Keywords :
deconvolution; image processing; image resolution; near-field scanning optical microscopy; 2-D distributions; SNOM; Tikhonov´s method; deconvolution; image resolution; image sharpness; microwave subsurface imaging; near-field image rectification; scanning near-field optical microscopy; Extraterrestrial measurements; Image resolution; Magnetic field measurement; Microwave imaging; Optical distortion; Optical films; Optical imaging; Optical microscopy; Probes; Transfer functions;
Conference_Titel :
Transparent Optical Networks, 2002. Proceedings of the 2002 4th International Conference on
Print_ISBN :
0-7803-7375-8
DOI :
10.1109/ICTON.2002.1009543
