• DocumentCode
    1724100
  • Title

    Improving Fault Tolerance by Using Reconfigurable Asynchronous Circuits

  • Author

    Friesenbichler, Werner ; Panhofer, Thomas ; Delvai, Martin

  • Author_Institution
    Austrian Aerosp. GmbH, Vienna
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    To achieve fault tolerance several tasks have to be performed, from fault detection up to recovery procedures. Sophisticated methods for each sub-task were and are still developed, but rarely a complete solution is proposed on circuit level. This paper fills the gap by proposing a concept that combines all required steps to implement fault tolerant digital circuits. The approach is based on asynchronous Four-State Logic (FSL) logic, which belongs to the family of Quasi Delay Insensitive (QDI) circuits. Contrary to conventional approaches, using synchronous logic plus additional hardware and/or software to achieve fault tolerance, we use the inherent properties of FSL for fault detection, fault localization and fault recovery. Only deadlock detection and error mitigation require an enhancement of the conventional FSL (four state logic) design. For this purpose, a monitoring unit has to be added and self-healing cells were developed that can be handled as conventional logic within the design flow. The feasibility of the approach is verified by a first prototype implementation of a fault tolerant adder circuit.
  • Keywords
    adders; fault location; fault tolerance; logic circuits; asynchronous four-state logic; conventional logic; deadlock detection; error mitigation; fault detection; fault localization; fault recovery; fault tolerant adder circuit; fault tolerant digital circuits; four state logic; quasi delay insensitive circuits; reconfigurable asynchronous circuits; self-healing cells; synchronous logic; Asynchronous circuits; Circuit faults; Delay; Digital circuits; Electrical fault detection; Fault tolerance; Hardware; Logic circuits; Logic design; System recovery;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on
  • Conference_Location
    Bratislava
  • Print_ISBN
    978-1-4244-2276-0
  • Electronic_ISBN
    978-1-4244-2277-7
  • Type

    conf

  • DOI
    10.1109/DDECS.2008.4538799
  • Filename
    4538799