Title :
SoCECT: System on Chip Embedded Core Test
Author :
Higgins, Michael ; MacNamee, Ciaran ; Mullane, Brendan
Author_Institution :
Dept. of Electron. & Comput. Eng., Univ. of Limerick, Limerick
Abstract :
This paper presents SoCECT (system on chip embedded core test), a novel test controller architecture that allows multiple IEEE 1500 wrapped cores within a SoC to be tested concurrently. SoCECT makes use of the IEEE 1149.1 JTAG state machine to operate the test controller and also to allow for future integration with an IEEE P1687 interface. SoCECT also includes a test access mechanism (TAM) methodology(distributed architecture) that reuses the physical connections of the SoC system bus to provide an efficient transport medium for structural and functional test vectors between the embedded test controller and IEEE 1500 wrapped cores.
Keywords :
IEEE standards; embedded systems; integrated circuit testing; system-on-chip; IEEE 1149.1 JTAG state machine; IEEE P1687 interface; SoC system; SoCECT; distributed architecture; embedded test controller; multiple IEEE 1500 wrapped cores; system on chip embedded core test; test access mechanism; test controller architecture; Automatic testing; Circuit testing; Control systems; Integrated circuit interconnections; Integrated circuit testing; Logic testing; Silicon; System buses; System testing; System-on-a-chip;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on
Conference_Location :
Bratislava
Print_ISBN :
978-1-4244-2276-0
Electronic_ISBN :
978-1-4244-2277-7
DOI :
10.1109/DDECS.2008.4538811