Title :
A low cost implementation of automated RF test of a LNA
Author :
Kaufman, Kris K. ; Baker, T.R.
Author_Institution :
Radio Products Division, Semiconductor Products Sector, Motorola, Inc., Tempe, AZ, USA
Abstract :
A low cost, automated, high volume RF test setup for a low-noise amplifier (LNA) was realized. A standard production DC test system and handler were modified with the addition of a standard vector network analyzer to measure sparameters at 1.9 GHz. Motivation for a low cost RF test methodology came from the need to minimize production costs of the high volume MBC13916 LNA. The solution achieved accurate and reliable low cost RF testing. An in-depth analysis of the test data was performed to correlate the data to the existing RF test setup and to verify the impact on the final cost per part of performing RF test.
Keywords :
Automatic testing; Costs; Measurement standards; Packaging machines; Performance evaluation; Production; Radio frequency; Software testing; System testing; Test equipment;
Conference_Titel :
ARFTG Conference Digest, Spring 2003. 61st
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-7994-2
DOI :
10.1109/ARFTGS.2003.1216863