• DocumentCode
    1724604
  • Title

    First direct beta measurenent for parasitic lateral bipolar transistors in fully-depleted SOI MOSFETs

  • Author

    Ploeg, Eric Ver ; Nguyen, Cuong ; Kistler, Neal ; Won, Simon ; Woo, Jason ; Plummer, James

  • Author_Institution
    University of California
  • fYear
    1993
  • fDate
    6/15/1905 12:00:00 AM
  • Firstpage
    26
  • Lastpage
    27
  • Keywords
    Bipolar transistors; Charge carrier processes; Current measurement; Data mining; Electric breakdown; Feedback; Gain measurement; Impact ionization; MOSFET circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 1993. 51st Annual
  • Type

    conf

  • DOI
    10.1109/DRC.1993.1009566
  • Filename
    1009566
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1724604