Title :
A high speed and low power on CMOS/SOI technology
Author :
Lee, M. ; Fujishima, M. ; Asada, K.
Author_Institution :
The University of Tokyo
fDate :
6/15/1905 12:00:00 AM
Keywords :
CMOS technology; Capacitance; Inverters; Length measurement; Power dissipation; Power measurement; Propagation delay; Ring oscillators; Semiconductor device modeling; Voltage;
Conference_Titel :
Device Research Conference, 1993. 51st Annual
DOI :
10.1109/DRC.1993.1009569