Matioubian, M. ; Jellolan, L.M. ; Lul, M. ; Liu, Takyiu ; Larson, Lawrence E. ; Nguyen, Loi D. ; Le, Minh V.
Author_Institution :
Hughes Research Laboratories
fYear :
1993
fDate :
6/15/1905 12:00:00 AM
Firstpage :
57
Lastpage :
58
Keywords :
Breakdown voltage; Current measurement; Frequency measurement; Gain measurement; HEMTs; Indium phosphide; Knee; MODFETs; Radio frequency; Voltage measurement;
