• DocumentCode
    1725020
  • Title

    GaInP/GaAs HBTs for high-speed integrated circuit applications

  • Author

    Ho, W.J. ; Chang, M.F. ; Sailer, A. ; Zampardi, P. ; Deakin, D. ; McDermott, B. ; Pierson, R. ; Higgins, J.A.

  • Author_Institution
    Rockwell International Science Center
  • fYear
    1993
  • fDate
    6/15/1905 12:00:00 AM
  • Firstpage
    63
  • Lastpage
    64
  • Keywords
    Circuit noise; Electrical resistance measurement; Frequency conversion; Gain measurement; Gallium arsenide; Heterojunction bipolar transistors; High speed integrated circuits; Integrated circuit noise; Noise measurement; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 1993. 51st Annual
  • Type

    conf

  • DOI
    10.1109/DRC.1993.1009583
  • Filename
    1009583
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1725020