Title :
PImMS: A self-triggered, 25ns resolution monolithic CMOS sensor for Time-of-Flight and Imaging Mass Spectrometry
Author :
Sedgwick, I. ; Clark, A. ; Crooks, J. ; Turchetta, R. ; Hill, L. ; John, JJ ; Nomerotski, A. ; Pisarczyk, R. ; Brouard, M. ; Gardiner, SH ; Halford, E. ; Lee, J. ; Lipciuc, ML ; Slater, C. ; Vallance, C. ; Wilman, E.S. ; Winter, B. ; Yuen, W.H.
Author_Institution :
Sci. & Technol. Facilities Council, Rutherford Appleton Lab., Didcot, UK
Abstract :
In this paper, we present the Pixel Imaging Mass Spectrometry (PImMS) sensor, a pixelated Time-of-Flight (TOF) sensor for use in mass spectrometry. The device detects any event which produces a signal above a programmable threshold with a timing resolution of 25ns. Both analogue and digital readout modes are available and all pixels can be individually trimmed to improve noise performance. The pixels themselves contain analogue signal conditioning circuitry as well as complex logic totalling more than 600 transistors. This large number can be achieved without any loss of quantum efficiency thanks to the use of the patented Isolated N-well Monolithic Active Pixels (INMAPS) process. In this paper, we examine the design of the PImMS 1.0 device and its successor PImMS 2.0, a significantly enlarged sensor with several added features. We will also present some initial results from mass spectrometry experiments performed with PImMS 1.0.
Keywords :
CMOS image sensors; digital readout; monolithic integrated circuits; signal conditioning circuits; time of flight mass spectroscopy; INMAPS process; PImMS 1.0 device; PImMS 2.0, device; analogue readout mode; analogue signal conditioning circuit; complex logic totalling; digital readout mode; isolated N-well monolithic active pixel; monolithic CMOS sensor; noise performance; pixel imaging mass spectrometry; quantum efficiency; self-triggered sensor; time 25 ns; time of flight spectrometry; CMOS integrated circuits; Cameras; Detectors; Ions; Mass spectroscopy; Registers;
Conference_Titel :
New Circuits and Systems Conference (NEWCAS), 2012 IEEE 10th International
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-0857-1
Electronic_ISBN :
978-1-4673-0858-8
DOI :
10.1109/NEWCAS.2012.6329065