• DocumentCode
    1725072
  • Title

    PImMS: A self-triggered, 25ns resolution monolithic CMOS sensor for Time-of-Flight and Imaging Mass Spectrometry

  • Author

    Sedgwick, I. ; Clark, A. ; Crooks, J. ; Turchetta, R. ; Hill, L. ; John, JJ ; Nomerotski, A. ; Pisarczyk, R. ; Brouard, M. ; Gardiner, SH ; Halford, E. ; Lee, J. ; Lipciuc, ML ; Slater, C. ; Vallance, C. ; Wilman, E.S. ; Winter, B. ; Yuen, W.H.

  • Author_Institution
    Sci. & Technol. Facilities Council, Rutherford Appleton Lab., Didcot, UK
  • fYear
    2012
  • Firstpage
    497
  • Lastpage
    500
  • Abstract
    In this paper, we present the Pixel Imaging Mass Spectrometry (PImMS) sensor, a pixelated Time-of-Flight (TOF) sensor for use in mass spectrometry. The device detects any event which produces a signal above a programmable threshold with a timing resolution of 25ns. Both analogue and digital readout modes are available and all pixels can be individually trimmed to improve noise performance. The pixels themselves contain analogue signal conditioning circuitry as well as complex logic totalling more than 600 transistors. This large number can be achieved without any loss of quantum efficiency thanks to the use of the patented Isolated N-well Monolithic Active Pixels (INMAPS) process. In this paper, we examine the design of the PImMS 1.0 device and its successor PImMS 2.0, a significantly enlarged sensor with several added features. We will also present some initial results from mass spectrometry experiments performed with PImMS 1.0.
  • Keywords
    CMOS image sensors; digital readout; monolithic integrated circuits; signal conditioning circuits; time of flight mass spectroscopy; INMAPS process; PImMS 1.0 device; PImMS 2.0, device; analogue readout mode; analogue signal conditioning circuit; complex logic totalling; digital readout mode; isolated N-well monolithic active pixel; monolithic CMOS sensor; noise performance; pixel imaging mass spectrometry; quantum efficiency; self-triggered sensor; time 25 ns; time of flight spectrometry; CMOS integrated circuits; Cameras; Detectors; Ions; Mass spectroscopy; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    New Circuits and Systems Conference (NEWCAS), 2012 IEEE 10th International
  • Conference_Location
    Montreal, QC
  • Print_ISBN
    978-1-4673-0857-1
  • Electronic_ISBN
    978-1-4673-0858-8
  • Type

    conf

  • DOI
    10.1109/NEWCAS.2012.6329065
  • Filename
    6329065