Title :
Very low forward drop JBS rectifiers fabricated using submicron technology
Author :
Mehrotra, Manoj ; Baliga, B.J.
Author_Institution :
North Carolina State University
fDate :
6/15/1905 12:00:00 AM
Keywords :
Breakdown voltage; Chromium; Doping; Leakage current; Low voltage; P-n junctions; Power supplies; Rectifiers; Schottky barriers; Temperature;
Conference_Titel :
Device Research Conference, 1993. 51st Annual
DOI :
10.1109/DRC.1993.1009606