Title :
A novel quantum effect fet with resonantly modulated transfer characteristics
Author :
Ohno, Y. ; Tsuchiya, M. ; Sakaki, H.
Author_Institution :
Institute of Industrial Science, Univ. of Tokyo
fDate :
6/15/1905 12:00:00 AM
Keywords :
Degradation; Double-gate FETs; Electron mobility; Energy states; Gallium arsenide; Intrusion detection; Optical scattering; Particle scattering; Resonance; Voltage;
Conference_Titel :
Device Research Conference, 1993. 51st Annual
DOI :
10.1109/DRC.1993.1009612