Implementation of Boundary-scan testing Platform Based on Programming with Labwindows/cvi

With the development of VLSI chips and application of boundary-scan testing, large changes occurred in the auto testing systems, and boundary-scan testing which offers the capability to efficiently test components on PCBs with tight lead spacing become the central test ways gradually in stead of the traditional test methods. The boundary-scan testing is well-known and researched widely because of its special test technology. This paper first introduced some basics about boundary-scan testing in a nutshell, and how to institute the testing platform with Labwindows/cvi, included hardware framework and software realization. In the software side, it described the integrality test, interconnect test and memory´s access of the Jtag scan chain, hereinto, the interface functions using in the testing platform and their uses were present. Finally give the application and its results to validate the functions of the boundary-scan testing platform.