DocumentCode :
1725898
Title :
Characterization and high speed digital application of GaAs MESFETs on Si substrates
Author :
Onozawa, S. ; Yamamoto, N. ; Kimura, T. ; Sano, Y. ; Akiyama, M.
Author_Institution :
Oki Electric Industry Co., Ltd.
fYear :
1993
fDate :
6/15/1905 12:00:00 AM
Firstpage :
146
Lastpage :
147
Keywords :
Crystallization; FETs; Gallium arsenide; Large scale integration; MESFETs; Microscopy; Residual stresses; Ring oscillators; Threshold voltage; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference, 1993. 51st Annual
Type :
conf
DOI :
10.1109/DRC.1993.1009618
Filename :
1009618
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1725898
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