• DocumentCode
    1725898
  • Title

    Characterization and high speed digital application of GaAs MESFETs on Si substrates

  • Author

    Onozawa, S. ; Yamamoto, N. ; Kimura, T. ; Sano, Y. ; Akiyama, M.

  • Author_Institution
    Oki Electric Industry Co., Ltd.
  • fYear
    1993
  • fDate
    6/15/1905 12:00:00 AM
  • Firstpage
    146
  • Lastpage
    147
  • Keywords
    Crystallization; FETs; Gallium arsenide; Large scale integration; MESFETs; Microscopy; Residual stresses; Ring oscillators; Threshold voltage; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 1993. 51st Annual
  • Type

    conf

  • DOI
    10.1109/DRC.1993.1009618
  • Filename
    1009618