DocumentCode :
1725903
Title :
Numerical resolution of charge transport in cross-linked polyethylene by means of a bipolar model with a distribution of traps
Author :
Boufayed, F. ; Leroy, S. ; Teyssedre, G. ; Laurent, C. ; Segur, P. ; Cooper, E. ; Dissado, L.A. ; Montanari, G.C.
Author_Institution :
Inst. de Genie Electr., Electron. et Plasmas, Univ. Paul Sabatier, Toulouse, France
Volume :
2
fYear :
2004
Firstpage :
562
Abstract :
We present a bipolar model of conduction providing time-dependent solutions for charge densities under uniform DC field. The model assumes the existence of an exponential distribution of trap depth for electrons and holes, with an upper limit in trap depth. Charges are supplied through Schottky injection at both electrodes. Charges move within the insulation through a hopping mechanism. Space charge profiles and external current are simulated in the transient regime following voltage application/grounding in DC stress. The objective is to describe the behaviour of cross-linked polyethylene.
Keywords :
Schottky effect; electron traps; hole traps; hopping conduction; polyethylene insulation; space charge; transients; DC field; DC stress; Schottky injection; bipolar model; charge densities; charge transport; cross-linked polyethylene; electrodes; electron trap; exponential distribution; holes trap; hopping mechanism; insulation; numerical resolution; space charge profiles; time-dependent solutions; Charge carrier processes; Electrodes; Electron traps; Exponential distribution; Grounding; Insulation; Polyethylene; Space charge; Stress; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8348-6
Type :
conf
DOI :
10.1109/ICSD.2004.1350493
Filename :
1350493
Link To Document :
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