Numerical resolution of charge transport in cross-linked polyethylene by means of a bipolar model with a distribution of traps

Author

Boufayed, F. ; Leroy, S. ; Teyssedre, G. ; Laurent, C. ; Segur, P. ; Cooper, E. ; Dissado, L.A. ; Montanari, G.C.

Author_Institution

Inst. de Genie Electr., Electron. et Plasmas, Univ. Paul Sabatier, Toulouse, France

Volume

2

fYear

2004

Firstpage

562

Abstract

We present a bipolar model of conduction providing time-dependent solutions for charge densities under uniform DC field. The model assumes the existence of an exponential distribution of trap depth for electrons and holes, with an upper limit in trap depth. Charges are supplied through Schottky injection at both electrodes. Charges move within the insulation through a hopping mechanism. Space charge profiles and external current are simulated in the transient regime following voltage application/grounding in DC stress. The objective is to describe the behaviour of cross-linked polyethylene.

Keywords

Schottky effect; electron traps; hole traps; hopping conduction; polyethylene insulation; space charge; transients; DC field; DC stress; Schottky injection; bipolar model; charge densities; charge transport; cross-linked polyethylene; electrodes; electron trap; exponential distribution; holes trap; hopping mechanism; insulation; numerical resolution; space charge profiles; time-dependent solutions; Charge carrier processes; Electrodes; Electron traps; Exponential distribution; Grounding; Insulation; Polyethylene; Space charge; Stress; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on

Print_ISBN

0-7803-8348-6

Type

conf

DOI

10.1109/ICSD.2004.1350493

Filename

1350493