DocumentCode :
1726165
Title :
Life-cycle-cost assessment and correlation between degradation-diagnosis parameter and degradation degree
Author :
Wu, K. ; Hara, N. ; Shimakage, T. ; Kato, T. ; Okamoto, T. ; Suzuoki, Y.
Author_Institution :
Dept. of Eng., Leicester Univ., UK
Volume :
2
fYear :
2004
Firstpage :
611
Abstract :
The effectiveness of diagnosis method is closely related to the correlation between the parameter used for diagnosis criterion (degradation parameter) and the degree of degradation. In this paper, as an example, two parameters, the maximum water-tree length and dielectric loss tan δ, for water-tree degradation in power cables were compared. Assuming that both the parameters could be measured non-destructively and the costs for diagnosis were the same, the minimum total life-cycle costs which corresponded to the optimized diagnostic parameters, e.g. diagnosis interval, criterion, etc., were calculated. As a result, the total cost for the case of diagnosis based on the maximum water-tree length was much lower than that for the case of tan δ. This suggested that the maximum water-tree length reflects the degradation degree much better than the dielectric loss (tan δ), and practically the non-destructive diagnosis method based on the measurement of parameters related to water-tree length, e.g. residual-charge measurement, is expected to be more efficient.
Keywords :
charge measurement; dielectric loss measurement; dielectric losses; life cycle costing; nondestructive testing; power cable testing; reliability; trees (electrical); degradation parameter; diagnosis parameter; dielectric loss tangent; life cycle-cost assessment; nondestructive diagnosis measurement; power cables; residual charge measurement; water tree degradation; water tree length; Charge measurement; Cost function; Current measurement; Degradation; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Length measurement; Loss measurement; Power cables;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8348-6
Type :
conf
DOI :
10.1109/ICSD.2004.1350505
Filename :
1350505
Link To Document :
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