• DocumentCode
    1726230
  • Title

    55V Integrated Power and Non-Volatile Technology for Solid State Lighting Applications

  • Author

    Letavic, T. ; Cook, R. ; Sharma, S. ; Brock, R. ; Mandhare, C. ; Effing, H. ; Dormans, D. ; Daniel, B. ; Deurenberg, P. ; Rooijackers, C. ; de Nie, R.

  • Author_Institution
    NXP Semicond., Hopewell Junction, NY
  • fYear
    2008
  • Firstpage
    60
  • Lastpage
    63
  • Abstract
    This paper presents a process in which a 55 V-class of power devices is added to baseline 0.25 um 2.5 V/5 V/ 20 V CMOS technology by forming asymmetric extended-drain device structures in which an inverted well design concept is utilized to form an extended-drain dielectric region. The RsP-BVdS figure-of-merit is consistent with best-in-class (0.65 mOhm cm2 / 70 V NMOS, 1.60 mOhm cm2 / 70 V PMOS), and the voltage handling is drift-length scalable from 20 V to over 75 V. Three classes of non-volatile memory are modularly implemented in the process flow consisting of single- polysilicon hot-carrier programmed OTP, single polysilicon 2T FN-FN MTP, and double-polysilicon 2T EEPROM. The combination of high-performance integrated power devices with non-volatile memory results in cost-effective implementation of features necessary for solid-state lighting systems.
  • Keywords
    CMOS integrated circuits; EPROM; power electronics; random-access storage; CMOS technology; asymmetric extended-drain device structures; best-in-class; double-polysilicon 2T EEPROM; extended-drain dielectric region; figure-of-merit; integrated power; nonvolatile memory; nonvolatile technology; power devices; single polysilicon 2T FN-FN MTP; single-polysilicon hot-carrier programmed OTP; solid state lighting systems; voltage 2.5 V; voltage 20 V; voltage 5 V; voltage 55 V; voltage 70 V; voltage 75 V; voltage handling; CMOS process; CMOS technology; Control systems; Dielectric devices; Dielectric substrates; Light emitting diodes; Nonvolatile memory; Optical control; Solid state lighting; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and IC's, 2008. ISPSD '08. 20th International Symposium on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4244-1532-8
  • Electronic_ISBN
    978-1-4244-1533-5
  • Type

    conf

  • DOI
    10.1109/ISPSD.2008.4538897
  • Filename
    4538897