DocumentCode :
1726230
Title :
55V Integrated Power and Non-Volatile Technology for Solid State Lighting Applications
Author :
Letavic, T. ; Cook, R. ; Sharma, S. ; Brock, R. ; Mandhare, C. ; Effing, H. ; Dormans, D. ; Daniel, B. ; Deurenberg, P. ; Rooijackers, C. ; de Nie, R.
Author_Institution :
NXP Semicond., Hopewell Junction, NY
fYear :
2008
Firstpage :
60
Lastpage :
63
Abstract :
This paper presents a process in which a 55 V-class of power devices is added to baseline 0.25 um 2.5 V/5 V/ 20 V CMOS technology by forming asymmetric extended-drain device structures in which an inverted well design concept is utilized to form an extended-drain dielectric region. The RsP-BVdS figure-of-merit is consistent with best-in-class (0.65 mOhm cm2 / 70 V NMOS, 1.60 mOhm cm2 / 70 V PMOS), and the voltage handling is drift-length scalable from 20 V to over 75 V. Three classes of non-volatile memory are modularly implemented in the process flow consisting of single- polysilicon hot-carrier programmed OTP, single polysilicon 2T FN-FN MTP, and double-polysilicon 2T EEPROM. The combination of high-performance integrated power devices with non-volatile memory results in cost-effective implementation of features necessary for solid-state lighting systems.
Keywords :
CMOS integrated circuits; EPROM; power electronics; random-access storage; CMOS technology; asymmetric extended-drain device structures; best-in-class; double-polysilicon 2T EEPROM; extended-drain dielectric region; figure-of-merit; integrated power; nonvolatile memory; nonvolatile technology; power devices; single polysilicon 2T FN-FN MTP; single-polysilicon hot-carrier programmed OTP; solid state lighting systems; voltage 2.5 V; voltage 20 V; voltage 5 V; voltage 55 V; voltage 70 V; voltage 75 V; voltage handling; CMOS process; CMOS technology; Control systems; Dielectric devices; Dielectric substrates; Light emitting diodes; Nonvolatile memory; Optical control; Solid state lighting; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and IC's, 2008. ISPSD '08. 20th International Symposium on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1532-8
Electronic_ISBN :
978-1-4244-1533-5
Type :
conf
DOI :
10.1109/ISPSD.2008.4538897
Filename :
4538897
Link To Document :
بازگشت