DocumentCode :
1726237
Title :
Spectroscopic and chemometrics analysis of cable condition in the Artemis program
Author :
Herman, Henryk ; Thomas, Janet ; Stevens, Gary
Author_Institution :
Polymer Res. Centre, Surrey Univ., Guildford, UK
Volume :
2
fYear :
2004
Firstpage :
623
Abstract :
Infrared, Raman and UV-VIS spectroscopies have been used to investigate the chemical composition and structure of cross-linked polyethylene used in a set of high-voltage polyolefin-insulated cables, both before and after electrical stressing and thermal ageing. Acrylate oligomers present in the semi-conducting screen materials, and the breakdown products of cross-linking are observed to diffuse into the insulation with a diffusion profile that is ageing time and temperature dependent - it appears that temperature, not voltage, has by far the biggest effect on migration in these materials. Multivariate statistical analysis has been used to examine the relationships between both the chemical changes in the material and the "intrinsic variables" such as radial distance, ageing time, temperature and voltage stress condition as well as the "physical properties" including AC electrical breakdown strength, charge mobility and oxidation potential. In all cases, the increase or decrease of certain chemical groups can be associated with the changes observed in these properties. Well-populated chemometrics models, based on spectroscopy, can provide sound structure-property relationships and a predictive capability for cable condition assessment that could be extended to cable performance and other insulating materials.
Keywords :
Raman spectra; XLPE insulation; ageing; cable insulation; carrier mobility; chemiluminescence; electric breakdown; electric strength; electroluminescence; electromigration; organic semiconductors; oxidation; polymer structure; statistical analysis; AC electrical breakdown strength; Artemis program; Raman spectra; UV-visible spectra; acrylate oligomers; cable; charge mobility; chemical composition; chemical groups; chemical structure; chemometric models; cross linked polyethylene; diffusion profile; electrical stressing; high voltage polyolefin-insulated cables; infrared spectra; insulating materials; multivariate statistical analysis; oxidation potential; physical properties; semiconducting screen materials; spectroscopic analysis; structure-property relationships; thermal ageing time; voltage stress condition; Aging; Breakdown voltage; Cables; Chemicals; Infrared spectra; Polyethylene; Raman scattering; Spectroscopy; Temperature dependence; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8348-6
Type :
conf
DOI :
10.1109/ICSD.2004.1350508
Filename :
1350508
Link To Document :
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