• DocumentCode
    1726445
  • Title

    Minor alloying effects of Ni or Zn on microstructure and microhardness of Pb-free solders

  • Author

    Seo, Sun-Kyoung ; Cho, Moon Gi ; Kang, Sung K. ; Chang, Jaewon ; Lee, Hyuck Mo

  • Author_Institution
    Samsung Electron., Yongin, South Korea
  • fYear
    2011
  • Firstpage
    84
  • Lastpage
    89
  • Abstract
    To form reliable Pb-free solder joints, minor alloying additions of Ni or Zn to Sn-rich solders have been recommended recently. Several beneficial effects of Ni or Zn minor alloying additions to Pb-free solders were reported to improve solder joint reliability. But the effects of Ni or Zn minor alloying additions on the bulk properties of solders are not systematically evaluated in light of understanding the electromigration or mechanical reliability of solder joints. Therefore, in this study, the minor alloying effects of Ni or Zn on the microstructure and microhardness in terms of Ni or Zn composition and cooling rate are investigated. The amounts of minor alloying elements investigated are in the range of 0.05-0.15 wt% for Ni, and 0.2-0.6wt% for Zn, which cover the reported composition ranges to enhance solder/UBM joint reliability. Three cooling rates are employed during solidification; 0.02°C/s (furnace-cooling), about 5°C/s (air-cooling), and 100°C/s or higher (quenching). The microstructure of Ni or Zn doped solders is evaluated in terms of composition, undercooling during solidification, and cooling rate. The phase diagram analysis is conducted to explain the microstructural variations. The microstructures of Ni or Zn doped solders are well correlated to their microhardness data.
  • Keywords
    alloying additions; copper; crystal microstructure; microhardness; nickel alloys; phase diagrams; quenching (thermal); reliability; silver alloys; solders; solidification; tin alloys; undercooling; zinc alloys; Ni doped solder; Sn-rich solders; SnAgNi-Cu; SnAgZn-Cu; Zn doped solder; air cooling; alloying addition; cooling rate; furnace cooling; mechanical reliability; microhardness; minor alloying effect; nickel addition; phase diagram analysis; quenching; solder composition; solder joints; solder microstructure; solder-Cu UBM joint reliability; solidification; undercooling; zinc addition; Alloying; Cooling; Copper; Joints; Microstructure; Nickel; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898496
  • Filename
    5898496