• DocumentCode
    1726458
  • Title

    Solidification processes in the Sn-rich part of the SnCu system

  • Author

    Panchenko, Iuliana ; Mueller, Maik ; Wiese, Steffen ; Schindler, Sebastian ; Wolter, Klaus-juergen

  • Author_Institution
    Electron. Packaging Lab., Tech. Univ. Dresden, Dresden, Germany
  • fYear
    2011
  • Firstpage
    90
  • Lastpage
    99
  • Abstract
    In this study SnCu solder spheres (Ø 270 μm, CR ~ 1 K/s) were investigated in order to verify the solidified microstructure according to the Sn-rich part of the SnCu phase diagram. The investigated alloys are Sn99.9, SnCu0.25, SnCu0.5, SnCu0.7, SnCu0.9, SnCu1.2, SnCu1.5, and SnCu3.0. In order to understand the solidification process, such aspects as morphology, grain structure and undercooling were analysed. The microstructure was investigated by optical microscopy, SEM and EDX. The undercooling was measured by DSC. It will be shown that small SnCu solder spheres solidify not only with commonly known β-Sn dendrites and fine Cu6Sn5 IMCs in the interdendritic spacing, but with specific and systematic changes in morphology, which depend on composition. The successive morphology transitions were found: from 1) fine Cu6Sn5 IMCs in β-Sn to 2) small β-Sn cells to 3) β-Sn cellular/dendritic to 4) fine Cu6Sn5 IMCs in β-Sn or undirected β-Sn cells. The area fraction of these different morphologies and the number of grain orientations were estimated from the cross-sections of about 20 solder spheres per composition. This allows a quantitative description of the microstructure and its compositional dependency. The results also show that the formation of large Cu6Sn5 IMCs provokes more grain orientations compared to SnCu solders solidified without large intermetallic phases.
  • Keywords
    X-ray chemical analysis; copper alloys; crystal microstructure; differential scanning calorimetry; optical microscopy; phase diagrams; scanning electron microscopy; solders; solidification; tin alloys; undercooling; DSC; EDX; SEM; SnCu; compositional dependency; grain orientations; grain structure; interdendritic spacing; microstructure; morphology transitions; optical microscopy; phase diagram; size 270 mum; solder spheres; solidification; undercooling; Copper; Microstructure; Morphology; Optical microscopy; Scanning electron microscopy; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898497
  • Filename
    5898497