DocumentCode :
1726458
Title :
Solidification processes in the Sn-rich part of the SnCu system
Author :
Panchenko, Iuliana ; Mueller, Maik ; Wiese, Steffen ; Schindler, Sebastian ; Wolter, Klaus-juergen
Author_Institution :
Electron. Packaging Lab., Tech. Univ. Dresden, Dresden, Germany
fYear :
2011
Firstpage :
90
Lastpage :
99
Abstract :
In this study SnCu solder spheres (Ø 270 μm, CR ~ 1 K/s) were investigated in order to verify the solidified microstructure according to the Sn-rich part of the SnCu phase diagram. The investigated alloys are Sn99.9, SnCu0.25, SnCu0.5, SnCu0.7, SnCu0.9, SnCu1.2, SnCu1.5, and SnCu3.0. In order to understand the solidification process, such aspects as morphology, grain structure and undercooling were analysed. The microstructure was investigated by optical microscopy, SEM and EDX. The undercooling was measured by DSC. It will be shown that small SnCu solder spheres solidify not only with commonly known β-Sn dendrites and fine Cu6Sn5 IMCs in the interdendritic spacing, but with specific and systematic changes in morphology, which depend on composition. The successive morphology transitions were found: from 1) fine Cu6Sn5 IMCs in β-Sn to 2) small β-Sn cells to 3) β-Sn cellular/dendritic to 4) fine Cu6Sn5 IMCs in β-Sn or undirected β-Sn cells. The area fraction of these different morphologies and the number of grain orientations were estimated from the cross-sections of about 20 solder spheres per composition. This allows a quantitative description of the microstructure and its compositional dependency. The results also show that the formation of large Cu6Sn5 IMCs provokes more grain orientations compared to SnCu solders solidified without large intermetallic phases.
Keywords :
X-ray chemical analysis; copper alloys; crystal microstructure; differential scanning calorimetry; optical microscopy; phase diagrams; scanning electron microscopy; solders; solidification; tin alloys; undercooling; DSC; EDX; SEM; SnCu; compositional dependency; grain orientations; grain structure; interdendritic spacing; microstructure; morphology transitions; optical microscopy; phase diagram; size 270 mum; solder spheres; solidification; undercooling; Copper; Microstructure; Morphology; Optical microscopy; Scanning electron microscopy; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
978-1-61284-497-8
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2011.5898497
Filename :
5898497
Link To Document :
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