Title :
The role of field performance information in building in reliability
Author :
Pietrucha, Bernard M.
Author_Institution :
AT&T Bell Lab., Whippany, NJ, USA
Abstract :
The authors point out that analysis of the field performance of VLSI devices and feedback of that information to device designers has been instrumental in improving device reliability. Such a system is required for certification under the military Qualified Manufacturers list program, and is a required element of other certification systems, e.g., ISO-9000. Field performance information can also be used to model the expected reliability of new designs. A working feedback system which provides the information required for both product improvement and reliability prediction is described.<>
Keywords :
VLSI; application specific integrated circuits; circuit reliability; integrated circuit testing; military standards; ASIC devices; VLSI devices; building in reliability; certification systems; field performance; military Qualified Manufacturers list program; working feedback system; Aerospace industry; Certification; Feedback; Information analysis; Instruments; Manufacturing; Performance analysis; Stress; Testing; Very large scale integration;
Conference_Titel :
Reliability Physics Symposium, 1993. 31st Annual Proceedings., International
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-0782-8
DOI :
10.1109/RELPHY.1993.283298
