DocumentCode
1726480
Title
The role of field performance information in building in reliability
Author
Pietrucha, Bernard M.
Author_Institution
AT&T Bell Lab., Whippany, NJ, USA
fYear
1993
Firstpage
77
Lastpage
80
Abstract
The authors point out that analysis of the field performance of VLSI devices and feedback of that information to device designers has been instrumental in improving device reliability. Such a system is required for certification under the military Qualified Manufacturers list program, and is a required element of other certification systems, e.g., ISO-9000. Field performance information can also be used to model the expected reliability of new designs. A working feedback system which provides the information required for both product improvement and reliability prediction is described.<>
Keywords
VLSI; application specific integrated circuits; circuit reliability; integrated circuit testing; military standards; ASIC devices; VLSI devices; building in reliability; certification systems; field performance; military Qualified Manufacturers list program; working feedback system; Aerospace industry; Certification; Feedback; Information analysis; Instruments; Manufacturing; Performance analysis; Stress; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1993. 31st Annual Proceedings., International
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-0782-8
Type
conf
DOI
10.1109/RELPHY.1993.283298
Filename
283298
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