• DocumentCode
    1726568
  • Title

    Dependence of SnAgCu solder joint properties on solder microstructure

  • Author

    Arfaei, B. ; Tashtoush, T. ; Kim, N. ; Wentlent, L. ; Cotts, E. ; Borgesen, P.

  • Author_Institution
    Dept. of Phys. & Mater. Sci. Program, Binghamton Univ., Binghamton, NY, USA
  • fYear
    2011
  • Firstpage
    125
  • Lastpage
    132
  • Abstract
    It is well known that variations in the microstructure of lead free solders greatly affect their thermomechanical properties. Sn grain size, orientation and number, as well as secondary Ag3Sn and Cu6Sn5 precipitate sizes and numbers, are all seen to influence the mechanical response of solder joints during isothermal and thermal cycling. The solidification temperature of a SnAgCu solder joint dramatically affects its microstructure. Generally, smaller solder balls (e.g. CSP) undercool more, and thus their microstructure and properties are very different than larger solder balls (e.g. BGA). We report results of a study of the effects of solder joint volume, and pad sizes, on the microstructure and thermomechanical properties of solder joints. Solder joint shapes and dimensions spanned the ranges typical of BGA and CSP assemblies. Temperatures of solidification during cool-down were quantified by differential scanning calorimetry. Sn grain structures were characterized by crossed polarizer microscopy and scanning electron microscopy with electron backscattered diffraction. Precipitate sizes and distributions were measured using backscattered scanning electron microscopy. Corresponding properties, including hardness, strength and fatigue resistance were measured before and after aging for various lengths of times at temperatures up to 125°C. Smaller solder joints on smaller pads were shown to be harder and stronger than larger ones, but to age faster and eventually end up softer and weaker.
  • Keywords
    ageing; ball grid arrays; chip scale packaging; copper alloys; differential scanning calorimetry; electron backscattering; electron diffraction; fatigue; grain size; hardness; heat treatment; precipitation; scanning electron microscopy; shear strength; silver alloys; soldering; solders; solidification; tin alloys; undercooling; Ag3Sn precipitate; BGA assembly; CSP assembly; Cu6Sn5 precipitate; SAC solder alloys; SnAgCu; SnAgCu solder joint properties; aging; backscattered scanning electron microscopy; chip scale package assembly; cool down; crossed polarizer microscopy; differential scanning calorimetry; electron backscattered diffraction; fatigue resistance; grain orientation; grain size; grain structure; hardness; isothermal cycling; mechanical response; pad size effect; secondary precipitate size; shear strength; solder balls; solder joint dimensions; solder joint microstructure; solder joint shape; solder joint volume; solidification temperature; temperature 125 degC; thermal cycling; thermomechanical properties; undercooling; Aging; Copper; Fatigue; Microstructure; Soldering; Temperature measurement; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898502
  • Filename
    5898502