Title :
Reliable solid-electrolyte crossbar switch for programmable logic device
Author :
Banno, N. ; Sakamoto, T. ; Tada, M. ; Miyamura, M. ; Yabe, Y. ; Saito, Y. ; Ishida, S. ; Okamoto, K. ; Hada, H. ; Kasai, N. ; Iguchi, N. ; Aono, M.
Author_Institution :
Device Platforms Res. Labs., NEC Corp., Sagamihara, Japan
Abstract :
Solid-electrolyte crossbar switch (namely NanoBridge) with low programming current of 420μA and highly reliable ON state against pulsed-alternating current (AC) stress is demonstrated under practical operating conditions of a programmable logic device (PLD). The ON-state duration under a pulsed-AC stress is achieved >10 years at 150°C. The high reliability under AC originates from the fact that the stress induced by Cu+ ion migration at a negative bias is recovered by a positive bias. NanoBridge is applicable in a scaled-down, nonvolatile PLD for hp28 and beyond.
Keywords :
nanotechnology; programmable logic devices; solid electrolytes; ON-state duration; current 420 muA; nanobridge; programmable logic device; pulsed-alternating current stress; solid-electrolyte crossbar switch; temperature 150 C; Copper; Integrated circuit reliability; Resistance; Stress; Switches; Wire; programmable logic; reliability under AC stress; solid-electrolyte switch;
Conference_Titel :
VLSI Technology (VLSIT), 2010 Symposium on
Conference_Location :
Honolulu
Print_ISBN :
978-1-4244-5451-8
Electronic_ISBN :
978-1-4244-5450-1
DOI :
10.1109/VLSIT.2010.5556192
