DocumentCode
1726663
Title
Automatic ion beam adjustment system based on simplex method
Author
Tanaka, Teruya ; Sato, Fuminobu ; Iida, Toshiyuki
Author_Institution
Dept. of Electron., Osaka Univ., Japan
Volume
2
fYear
2001
Firstpage
681
Abstract
Automatic beam adjustment systems based on the simplex method were introduced into a versatile ion beam irradiation system. This paper gives an overview and performance of the automatic beam extraction and transport systems. Maximization of extracted beam current, beam positioning and minimization of focused beam diameter were accomplished by optimization of parameters. The present adjustment systems were highly useful for various ion irradiation experiments.
Keywords
beam handling techniques; particle beam diagnostics; beam current; beam positioning; focused beam diameter; ion beam adjustment system; simplex method; Data mining; Electrodes; Information systems; Ion beams; Ion sources; Optimization methods; Sensor fusion; Sensor systems; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2001 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-7324-3
Type
conf
DOI
10.1109/NSSMIC.2001.1009651
Filename
1009651
Link To Document