DocumentCode :
1726663
Title :
Automatic ion beam adjustment system based on simplex method
Author :
Tanaka, Teruya ; Sato, Fuminobu ; Iida, Toshiyuki
Author_Institution :
Dept. of Electron., Osaka Univ., Japan
Volume :
2
fYear :
2001
Firstpage :
681
Abstract :
Automatic beam adjustment systems based on the simplex method were introduced into a versatile ion beam irradiation system. This paper gives an overview and performance of the automatic beam extraction and transport systems. Maximization of extracted beam current, beam positioning and minimization of focused beam diameter were accomplished by optimization of parameters. The present adjustment systems were highly useful for various ion irradiation experiments.
Keywords :
beam handling techniques; particle beam diagnostics; beam current; beam positioning; focused beam diameter; ion beam adjustment system; simplex method; Data mining; Electrodes; Information systems; Ion beams; Ion sources; Optimization methods; Sensor fusion; Sensor systems; System testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2001 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-7324-3
Type :
conf
DOI :
10.1109/NSSMIC.2001.1009651
Filename :
1009651
Link To Document :
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