DocumentCode :
1726812
Title :
Equivalent model for shielded microstrip transmission lines over lossy layered substrates
Author :
Jain, Sidharath ; Song, Jiming ; Kamgaing, Telesphor ; Mekonnen, Yidnekachew
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
fYear :
2011
Firstpage :
195
Lastpage :
201
Abstract :
An equivalent model for a lossy shielded microstrip line on layered media is constructed by replacing the layered media with a single effective medium and a detailed analysis of its validity at different frequencies and different range of dimensions has been presented for application to on chip interconnects. The relative permittivity for a single layer microstrip which results in the same propagation constant for the dominant mode as the layered one at a given frequency is considered to be the equivalent. The results show that this model is frequency independent for layered structures when the given frequency and frequency of operation are less than the transition frequency (i.e. the frequency at which there is a significant change in the equivalent dielectric constant (ϵreq)). For frequencies higher than the transition frequency the equivalent model is not frequency independent but it gives good results for the higher order mode although it is derived using the dominant mode. Also it is seen that at low frequency ϵreq depends on the layers near to the signal metal but at higher frequencies it depends on the layer with the highest value of ϵr irrespective of its location w.r.t to the metal strip.
Keywords :
integrated circuit interconnections; microstrip lines; permittivity; transmission lines; chip interconnects; equivalent dielectric constant; equivalent model; layered structures; lossy layered substrates; relative permittivity; shielded microstrip transmission lines; single layer microstrip; Conductivity; Dielectric constant; Dielectric losses; Metals; Microstrip; Propagation constant; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
978-1-61284-497-8
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2011.5898513
Filename :
5898513
Link To Document :
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