DocumentCode :
1726850
Title :
Post-buckling of micromachined beams
Author :
Fang, W. ; Wickert, J.A.
Author_Institution :
Dept. of Mech. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
1994
fDate :
6/16/1905 12:00:00 AM
Firstpage :
182
Lastpage :
187
Abstract :
The static deformation of micromachined beams under prescribed in-plane compressive stress is studied by analytical and experimental means over the pre-buckling, transition, and post-buckling load ranges. The finite amplitude of the beam in its post-buckled state is predicted by modeling the non-linear dependence of its compressive stress on the out-of-plane deformation. In addition, the model explicitly considers the net effect of slight imperfections, which can include fabrication defects, geometric irregularities, or non-ideal loading, on the beam´s behavior in the near-buckling regime. As an application, clamped-clamped silicon dioxide beams are fabricated through conventional bulk micromachining, and their deflected profiles are measured through three-dimensional optical profilometry. The measurements are compared to the post-buckled amplitudes and shapes that are predicted by the model, and by existing simpler models that do not include the effects of both non-linearity and imperfection. As borne out by the data, when imperfections are considered, the beams exhibit continuous growth of the out-of-plane amplitude during transition from the prebuckled state to a post-buckled one, in contrast to sudden bifurcation at a critical load. By accounting for this behavior, the estimate of residual stress in the thin film from which the beams are fabricated can be improved, and the amplitude of common post-buckled micromachined structures can be predicted
Keywords :
buckling; SiO2; bifurcation; bulk micromachining; clamped-clamped silicon dioxide beams; critical load; deflected profiles; fabrication defects; finite amplitude; geometric irregularities; in-plane compressive stress; micromachined beams; near-buckling regime; nonideal loading; nonlinearity; out-of-plane amplitude; post-buckled micromachined structures; prebuckled state; residual stress; static deformation; three-dimensional optical profilometry; Compressive stress; Deformable models; Geometrical optics; Micromachining; Nonlinear optics; Optical device fabrication; Predictive models; Shape measurement; Silicon compounds; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 1994, MEMS '94, Proceedings, IEEE Workshop on
Conference_Location :
Oiso
Print_ISBN :
0-7803-1833-1
Type :
conf
DOI :
10.1109/MEMSYS.1994.555620
Filename :
555620
Link To Document :
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