• DocumentCode
    1727127
  • Title

    Buckled membranes for microstructures

  • Author

    Popescu, Dan S. ; Lammerink, Theo S J ; Elwenspoek, Miko

  • Author_Institution
    MESA Res. Inst., Twente Univ., Enschede, Netherlands
  • fYear
    1994
  • fDate
    6/16/1905 12:00:00 AM
  • Firstpage
    188
  • Lastpage
    192
  • Abstract
    Based on energy variation methods we calculated the deflection of membranes under the combined load of an external pressure and an internal lateral stress. A lateral load gives rise to buckling once a critical load is exceeded. The combination of transversal loads and lateral loads changes the properties of the membrane (and other structures) in the vicinity of the buckling load: The membrane deflects at all lateral loads and the critical load, above which two states are possible shifts. A result important for the design of microsystems, which are based on the buckling phenomenon, is the pressure required to switch the membrane from one state to the other. The theory is tested successfully with micromachined silicon/silicon-dioxide membranes
  • Keywords
    buckling; Si-SiO2; Young´s modulus; buckled membranes; combined load; critical load; deflection; elasticity; energy variation; internal lateral stress; lateral load; membrane deflects; micromachined Si/SiO2 membranes; micropumps; microstructures; microsystems; microvalves; switching pressure; transversal loads; Biomembranes; Capacitive sensors; Compressive stress; Internal stresses; Microstructure; Silicon; Switches; Testing; Thermal stresses; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1994, MEMS '94, Proceedings, IEEE Workshop on
  • Conference_Location
    Oiso
  • Print_ISBN
    0-7803-1833-1
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1994.555621
  • Filename
    555621