DocumentCode
1727127
Title
Buckled membranes for microstructures
Author
Popescu, Dan S. ; Lammerink, Theo S J ; Elwenspoek, Miko
Author_Institution
MESA Res. Inst., Twente Univ., Enschede, Netherlands
fYear
1994
fDate
6/16/1905 12:00:00 AM
Firstpage
188
Lastpage
192
Abstract
Based on energy variation methods we calculated the deflection of membranes under the combined load of an external pressure and an internal lateral stress. A lateral load gives rise to buckling once a critical load is exceeded. The combination of transversal loads and lateral loads changes the properties of the membrane (and other structures) in the vicinity of the buckling load: The membrane deflects at all lateral loads and the critical load, above which two states are possible shifts. A result important for the design of microsystems, which are based on the buckling phenomenon, is the pressure required to switch the membrane from one state to the other. The theory is tested successfully with micromachined silicon/silicon-dioxide membranes
Keywords
buckling; Si-SiO2; Young´s modulus; buckled membranes; combined load; critical load; deflection; elasticity; energy variation; internal lateral stress; lateral load; membrane deflects; micromachined Si/SiO2 membranes; micropumps; microstructures; microsystems; microvalves; switching pressure; transversal loads; Biomembranes; Capacitive sensors; Compressive stress; Internal stresses; Microstructure; Silicon; Switches; Testing; Thermal stresses; Transducers;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 1994, MEMS '94, Proceedings, IEEE Workshop on
Conference_Location
Oiso
Print_ISBN
0-7803-1833-1
Type
conf
DOI
10.1109/MEMSYS.1994.555621
Filename
555621
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