Title :
Low frequency noise characterization of very large value resistors
Author :
Arnaboldi, C. ; Bucci, C. ; Cremonesi, O. ; Fascilla, A. ; Nucciotti, A. ; Pavan, M. ; Pessina, G. ; Pirro, S. ; Previtali, E. ; Sisti, M.
Author_Institution :
Ist. Nazionale di Fisica Nucl., Milan, Italy
Abstract :
A very simple circuit configuration is described which allows to characterize the noise of very large value resistors. With this measurement setup we investigated the low frequency noise of large value resistors, tens of GΩ range, realized with different technologies, at different bias voltages. A technique is suggested that allows to reduce the low frequency noise contribution, by optimizing the connecting arrangement. A short review of the resistor noise theory is given.
Keywords :
circuit noise; nuclear electronics; radiation monitoring; resistors; bias voltages; low frequency noise characterization; radiation detectors; very large value resistors; Bolometers; Circuit noise; Detectors; Electrical resistance measurement; Low-frequency noise; Noise measurement; Resistors; Thermal resistance; Transfer functions; Voltage;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2001 IEEE
Print_ISBN :
0-7803-7324-3
DOI :
10.1109/NSSMIC.2001.1009671
