DocumentCode
1727231
Title
Qualifying ICs for space environments with the help of parameters modeling
Author
Shvetzov-Shilovsky, I.N. ; Belyakov, V.V. ; Cherepko, S.V. ; Pershenkov, V.S. ; Emelyanov, V.V.
Author_Institution
Dept. of Microelectron., Eng. Phys. Inst., Moscow, Russia
Volume
2
fYear
1997
Firstpage
641
Abstract
The method for qualifying CMOS ICs for space total-dose environment is developed. It combines physical modeling and usual test protocol. The method provides realistic estimations for the dose level of parametric failure under low-dose-rate irradiation
Keywords
CMOS integrated circuits; failure analysis; integrated circuit modelling; integrated circuit testing; radiation effects; space vehicle electronics; CMOS ICs; dose level; low-dose-rate irradiation; parameters modeling; parametric failure; physical modeling; space environments; test protocol; total-dose environment; Annealing; CMOS integrated circuits; CMOS process; Integrated circuit modeling; Predictive models; Protocols; Semiconductor device modeling; Temperature; Testing; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 1997. Proceedings., 1997 21st International Conference on
Conference_Location
Nis
Print_ISBN
0-7803-3664-X
Type
conf
DOI
10.1109/ICMEL.1997.632923
Filename
632923
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