• DocumentCode
    1727284
  • Title

    Bistable resistor (biristor) - gateless silicon nanowire memory

  • Author

    Han, Jin-Woo ; Choi, Yang-Kyu

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon, South Korea
  • fYear
    2010
  • Firstpage
    171
  • Lastpage
    172
  • Abstract
    A gateless NPN Si nanowire, which has been named `biristor´ originating from bistable resistor, is presented for a high-density and high-speed memory with a standard CMOS technology. A hysteric I-V characteristic is utilized for the data storage, exhibiting a write and read time of less than 2nsec, a sensing current window of 0.23mA, and a hold retention time of 200msec. The biristor is free of cyclic endurance/reliability problem induced by hot-carrier injection due to the gateless structure.
  • Keywords
    CMOS memory circuits; hot carriers; integrated circuit reliability; nanowires; resistors; silicon; CMOS technology; biristor; bistable resistor; current 0.23 mA; cyclic endurance; data storage; gateless silicon nanowire memory; hold retention time; hot-carrier injection; read time; sensing current window; time 200 ms; write time; FETs; Latches; Logic gates; Random access memory; Resistors; Sensors; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology (VLSIT), 2010 Symposium on
  • Conference_Location
    Honolulu
  • Print_ISBN
    978-1-4244-5451-8
  • Electronic_ISBN
    978-1-4244-5450-1
  • Type

    conf

  • DOI
    10.1109/VLSIT.2010.5556215
  • Filename
    5556215