Title :
A self-testing multiplexed CMOS stimulating probe for a 1024-site neural prosthesis
Author :
Yao, Y. ; Gulari, M.N. ; Hetke, J.F. ; Wise, K.D.
Author_Institution :
Eng. Res. Center, Michigan Univ., Ann Arbor, MI, USA
Abstract :
This paper describes a multiplexed silicon microprobe for selectively stimulating and recording in the central nervous system. The probe is used in a three-dimensional array and is designed as the basis for a fully-integrated neural prosthesis. CMOS circuitry delivers biphasic currents from -127 /spl mu/A to +127 /spl mu/A to selected sites with 1 /spl mu/A resolution. On-chip DACs operate with an integrated nonlinearity less than 0.2LSB while delivering an output voltage swing within 0.5 V of the (/spl plusmn/5 V) power rails. Simulataneous stimulation and recording is possible using on-chip preamplifiers having a gain 40 dB from 100 Hz to 10 kHz. In order to facilitate the microassembly of 3D arrays, the probe is designed to achieve full testability at the pre-release, post-release, and post-assembly levels.
Keywords :
CMOS integrated circuits; biomedical imaging; biomedical telemetry; digital-analogue conversion; elemental semiconductors; microelectrodes; multiplexing equipment; neurophysiology; preamplifiers; probes; prosthetics; silicon; -127 to 127 muA; 0.5 V; 1 muA; 100 Hz to 10 kHz; 3D arrays; 40 dB; CMOS circuitry; Si; biphasic currents; central nervous system recording; central nervous system stimulation; integrated neural prosthesis; integrated nonlinearity; microassembly; multiplexed silicon microprobe; on-chip DAC; on-chip preamplifiers; output voltage swing; post-assembly levels; post-release; pre-release; self-testing multiplexed CMOS stimulating probe; three-dimensional array; Built-in self-test; Central nervous system; Circuit simulation; Gain; Preamplifiers; Probes; Prosthetics; Rails; Silicon; Voltage;
Conference_Titel :
TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7731-1
DOI :
10.1109/SENSOR.2003.1216990