DocumentCode :
1727898
Title :
Semiconductor devices and superconducting interconnections at 77 K: super-semi or semi-super
Author :
Tewksbury, S.K. ; Hornak, L.A. ; Hatamian, M.
Author_Institution :
AT&T Bell Lab., Holmdel, NJ, USA
fYear :
1989
Firstpage :
14
Lastpage :
18
Abstract :
It is noted that, with semiconductor logic at 77 K providing an optimized, local active device behavior for logical operations, high-Tc superconducting transmission lines and Josephson tunnel junction drivers/receivers can provide a similarly optimized communications environment at 77 K. This combination of low-temperature active electronic devices and high-temperature superconducting interconnections is considered in the present work. The potential performance of transmission lines fabricated from thin-film, high-Tc superconductors is examined, and several practical issues degrading the potential performance of such interconnections are considered. Attention is given to issues connected with surface impedance, flux motion induced resistance, critical current density, thin film substrates, multilayer interconnections, high-quality surfaces, tunnel junction devices, large-area substrates, and reliability
Keywords :
VLSI; high-temperature superconductors; integrated circuit technology; superconducting junction devices; superconducting thin films; transmission lines; 77 K; Josephson tunnel junction drivers/receivers; VLSI; YBaCuO; communications environment; critical current density; flux motion induced resistance; high temperature superconductor; high-quality surfaces; large-area substrates; local active device behavior; multilayer interconnections; reliability; semiconductor logic; superconducting interconnections; superconducting thin films; superconducting transmission lines; surface impedance; thin film substrates; High temperature superconductors; Josephson junctions; Logic devices; Semiconductor devices; Substrates; Superconducting devices; Superconducting logic circuits; Superconducting thin films; Superconducting transmission lines; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Temperature Semiconductor Electronics, 1989., Proceedings of the Workshop on
Conference_Location :
Burlington, VT
Type :
conf
DOI :
10.1109/LTSE.1989.50173
Filename :
50173
Link To Document :
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