Title :
Simulation and experimental study of gray-tone lithography for the fabrication of arbitrarily shaped surfaces
Author :
Henke, W. ; Hoppe, W. ; Quenzer, H.J. ; Staudt-Fischbach, P. ; Wagner, B.
Author_Institution :
Fraunhofer-Inst. fur Silicon Technol, Berlin, Germany
fDate :
6/16/1905 12:00:00 AM
Abstract :
This paper reports on a study of a methodology for fabrication of arbitrarily shaped silicon structures using technologies common to standard IC manufacturing processes. Particular emphasis is put on the design and use of halftone transmission masks for the lithography step required in the fabrication process of mechanical, optical or electronics components. The experimental investigation and the design of gray-tone masks was supported by lithography simulation. Results are presented for both, simulated gray-tone patterns as well as experimental trials
Keywords :
silicon; Si; Si structures; arbitrarily shaped surfaces; fabrication; gray-tone lithography; halftone transmission masks; simulated gray-tone patterns; standard IC manufacturing processes; Frequency; Lithography; Monolithic integrated circuits; Optical device fabrication; Optical devices; Optical diffraction; Optical filters; Resists; Shape; Silicon;
Conference_Titel :
Micro Electro Mechanical Systems, 1994, MEMS '94, Proceedings, IEEE Workshop on
Conference_Location :
Oiso
Print_ISBN :
0-7803-1833-1
DOI :
10.1109/MEMSYS.1994.555624