Title :
Model for micropart planarization in capillary-based microassembly
Author :
Scott, K.L. ; Howe, R.T. ; Radke, C.J.
Author_Institution :
Dept. of Electr. Eng., California Univ., Berkeley, CA, USA
Abstract :
This paper describes a quantitative model for the planarization of microparts after their capture on capillary binding sites. We have found that three distinct processes (tilt correction, squeeze-film settling, and force stabilization) contribute to the equilibrium position of a micropart that has been assembled using capillary forces. The three processes affecting micropart planarization are a function of the pressure profile underneath the micropart, which can be determined by the radius of curvature at the capillary/assembly fluid interfaces. The tilt correction and squeeze-film settling processes, which planarize the micropart, may or may not occur by capillary fluid flow depending on the force stabilization process. We present a two-dimensional model used to describe the equilibrium settling time of the micropart as a function of all three processes, part size, capillary fluid volume, viscosity, and surface tension.
Keywords :
capillarity; microassembling; micromechanical devices; planarisation; surface tension; viscosity; capillary fluid flow; capillary-assembly fluid interfaces; capillary-based microassembly; force stabilization; micropart planarization; pressure profile; squeeze-film settling; surface tension; tilt correction; two-dimensional model; viscosity; Actuators; Adaptive optics; Assembly; Chromium; Gold; Microassembly; Optical arrays; Planarization; Semiconductor device modeling; Substrates;
Conference_Titel :
TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7731-1
DOI :
10.1109/SENSOR.2003.1217016