DocumentCode
1728172
Title
Demonstration of single-sided Compton scatter tomography in fan beams with an HPGe array
Author
Evans, Brian L. ; Martin, Jeffrey B. ; Burggraf, Larry W. ; Hangartner, T.N. ; Roggemann, M.C.
Author_Institution
Dept. of Eng. Phys., Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
Volume
2
fYear
2001
Firstpage
936
Abstract
An instrument is demonstrated whereby radiographic images of a sample´s electron density are compiled from the information encoded in the energy spectra of gamma rays backscattered from one side of the sample. Nondestructive inspection of aluminum airframes is the application of interest, so it is assumed that access is restricted to only one surface of the object under inspection. Use of energy coding allows imaging in a fan beam rather than independent interrogation of individual volume elements. The Multiplexed Compton Scatter Tomograph (MCST) instrument consists of an array of planar high-purity germanium detectors, a set of fan beam collimators, and a Cd109 radionuclide source. Instrument signals are converted to electron density images using a penalized weighted least squares image reconstruction algorithm coupled with a deterministic system model that includes effects of finite source and detector size, detector resolution and efficiency, attenuation, and Doppler broadening. The Doppler broadening, resulting from the momentum distribution of bound electrons, is significant at the energies used here. The proof-of-principle instrument is demonstrated on some aluminum samples. In an 8-mm thick sample with a 4 mm void in its center, contrast recovery of 90% is achieved. In a 10-mm thick sample with a 3 rum void at the back, about 85% of the contrast is recovered.
Keywords
aircraft testing; aluminium; germanium radiation detectors; nondestructive testing; tomography; voids (solid); 10 mm; 8 mm; Al; Al airframes; Doppler broadening; Ge; HPGe detectors; Multiplexed Compton Scatter Tomograph; airframes; fan beam collimators; penalized weighted least squares image reconstruction; single-sided Compton scatter tomography; Aluminum; Detectors; Electrons; Gamma rays; Inspection; Instruments; Optical imaging; Radiography; Scattering; Tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2001 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-7324-3
Type
conf
DOI
10.1109/NSSMIC.2001.1009709
Filename
1009709
Link To Document