DocumentCode
1728549
Title
Study by stroboscopic X-ray topography of the effects of the crystal defects on the modes of high performance resonators
Author
Capelle, Bernard ; Epelboin, Yves ; Detaint, Jacques
Author_Institution
Inst. de Miner. et de Phys. des Milieux Condenses (IMPMC), Univ. Pierre et Marie Curie (Paris VI), Paris, France
fYear
2010
Firstpage
578
Lastpage
583
Abstract
This paper considers the effect of dislocations on the vibration modes of thickness shear resonator and SAW delay line using quartz. It is observed that they are at the origin of mode shape modifications and non linear effects. The principal mechanism of interaction seems to be related to the creation of a stained bias state increasing the non-linear effects.
Keywords
X-ray topography; crystal defects; crystal resonators; quartz; shape measurement; stroboscopes; surface acoustic wave delay lines; vibration measurement; SAW delay line; crystal defects; high performance resonators; nonlinear effects; quartz; shape modifications; stroboscopic X-ray topography; thickness shear resonator; vibration modes; Crystals; Diffraction; Optical resonators; Shape; Strain; Stress; Vibrations;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium (FCS), 2010 IEEE International
Conference_Location
Newport Beach, CA
ISSN
1075-6787
Print_ISBN
978-1-4244-6399-2
Type
conf
DOI
10.1109/FREQ.2010.5556261
Filename
5556261
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