Title :
Software Reliability Modeling with Logistic Test Coverage Function
Author :
Li, Haifeng ; Li, Qiuying ; Lu, Minyan
Author_Institution :
Dept. of Eng. Syst. & Eng., Beihang Univ., Beijing
Abstract :
Test coverage is a good indicator for testing completeness and effectiveness. This paper utilizes the logistic function to describe the test coverage growth behavior. Based on the logistic test coverage function, a model that relates test coverage to fault detection is presented and fitted to one actual data set. The experimental results show that, compared with three existing models, the evaluation performance of this new model is the best at least with the experimental data. Finally, the logistic test coverage function is applied to the NHPP software reliability modeling for further research.
Keywords :
formal specification; program testing; software reliability; completeness testing; effectiveness testing; fault detection; logistic test coverage function; software reliability modeling; Application software; Engineering students; Equations; Fault detection; Logistics; Reliability engineering; Software reliability; Software testing; System testing; Systems engineering and theory; Fault Detection; Logistic Function; Software reliability modeling; Test coverage;
Conference_Titel :
Software Reliability Engineering, 2008. ISSRE 2008. 19th International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-0-7695-3405-3
Electronic_ISBN :
1071-9458
DOI :
10.1109/ISSRE.2008.51