• DocumentCode
    1728604
  • Title

    On the evolution of the properties and microstructure of backward compatible solder joints during cycling and aging

  • Author

    Jaradat, Younis ; Qasaimeh, Awni ; Kondos, Pericles ; Arfaei, Babak ; Borgesen, Peter

  • Author_Institution
    Dept. of Syst. Sci. & Ind. Eng., Binghamton Univ., Binghamton, NY, USA
  • fYear
    2011
  • Firstpage
    722
  • Lastpage
    730
  • Abstract
    A number of groups have published accelerated test results comparing backward compatible (mixed) solder joints to pure SnPb and lead free ones, but the question remains as to the actual reliability under realistic long term service conditions. We are addressing this in a comprehensive fundamental study of the evolution of the microstructure and resulting joint properties and performance for mixed solder joints. The present work reports results of reflowing 30 mil SAC305 balls onto Cu coated BGA pads with different amounts of SnPb paste, aging and/or cycling the joints and inspecting the microstructure by cross polarizer microscopy and SEM. The addition of small amounts of Pb was found to affect the solidification during cool-down from reflow, and thus the initial microstructure, in a profound fashion. The shapes and distributions of secondary precipitates were, as expected, different from those observed in `pure´ SAC305 joints and a large number of very small Pb inclusions were distributed within the Sn dendrites. As a result the mixed joints started out harder and did not soften as rapidly during thermal cycling and aging. In fact, an initial break up of elongated Ag3Sn precipitates first led to a slight hardening and strengthening. In addition thermal cycling induced recrystallization of the Sn was delayed and acceleration factors were lower. However, the strongly reduced sensitivity to aging suggests that mixed joints may compare more favorably to their `pure´ lead free counterparts in long term service than reflected by accelerated test results.
  • Keywords
    ageing; ball grid arrays; crystal microstructure; dendrites; hardening; lead alloys; reflow soldering; reliability; scanning electron microscopy; silver alloys; solders; solidification; tin alloys; Ag3Sn; Cu coated BGA pads; SAC305 balls; SAC305 joints; SEM; Sn dendrites; SnPb; aging; backward compatible solder joints; cross polarizer microscopy; hardening; joint properties; microstructures; mixed solder joints; recrystallization; reflow; reliability; solidification; strengthening; thermal cycling; Aging; Joints; Lead; Microstructure; Reliability; Soldering; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898593
  • Filename
    5898593