DocumentCode
1728651
Title
Characterization of a novel micromachined accelerometer with enhanced-MIDOS
Author
Bochobza-Degani, O. ; Yechieli, R. ; Bar-Lev, S. ; Yehuda, U.B. ; Nemirovsky, Y.
Author_Institution
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
Volume
2
fYear
2003
Firstpage
1395
Abstract
This paper reports the successful realization of a novel micromachined accelerometer with a highly sensitive in-plane optical motion sensor. Two arrays of CMOS integrated photodiodes are used to detect the motion of a matching micromachined suspended grid. Sub-angstrom displacements of the suspended grid are detected by the integrated readout electronics that amplify and subtract the resulting photocurrents from each array. The device is fabricated by deep reactive ion etching (DRIE) and then flip-chip bonded on the CMOS chip. A preliminary prototype with a natural frequency of 2500[Hz] exhibited a noise equivalent acceleration (NEA) of /spl sim/40[/spl mu/g//spl radic/(Hz)] and a dynamic range >90[dB] with linearity <0.1%.
Keywords
CMOS integrated circuits; accelerometers; flip-chip devices; microsensors; motion measurement; optical arrays; optical noise; optical sensors; photodiodes; readout electronics; sputter etching; 2500 Hz; CMOS integrated photodiodes arrays; deep reactive ion etching; enhanced MIDOS; in-plane optical motion sensor; integrated readout electronics; micromachined accelerometer; micromachined suspended grid; modulated integrative differential optical sensing; noise equivalent acceleration; photocurrents; sensitivity; Accelerometers; Bonding; Etching; Motion detection; Optical sensors; Photoconductivity; Photodiodes; Readout electronics; Sensor phenomena and characterization; Stimulated emission;
fLanguage
English
Publisher
ieee
Conference_Titel
TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-7731-1
Type
conf
DOI
10.1109/SENSOR.2003.1217035
Filename
1217035
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