DocumentCode
1728866
Title
Observation of the acoustoelectric effect in gallium nitride micromechanical bulk acoustic filters
Author
Gokhale, Vikrant J. ; Shim, Yonghyun ; Rais-Zadeh, Mina
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear
2010
Firstpage
524
Lastpage
529
Abstract
We report on the experimental verification of the acoustoelectric effect in gallium nitride (GaN) and present a model to describe this effect in GaN thickness-mode bulk acoustic filters. Filters are fabricated using 2.2 μm thick n-type GaN on high resistivity silicon epiwafers obtained from SOITEC. Acoustoelectric effect was observed by applying an electric field parallel to c-axis, the direction of acoustic wave propagation. Improvement in the insertion loss and out-of-band rejection was observed and Q amplifications exceeding 240% was achieved. Acoustoelectric effect makes it possible to dynamically tune the frequency response of GaN resonators and filters.
Keywords
acoustic filters; acoustic resonators; acoustic wave propagation; acoustoelectric effects; bulk acoustic wave devices; frequency response; gallium compounds; micromechanical devices; GaN; GaN thickness-mode bulk acoustic filters; Q amplifications; SOITEC; acoustic wave propagation; acoustoelectric effect experimental verification; electric field; frequency response; gallium nitride micromechanical bulk acoustic filters; high resistivity silicon epiwafers; insertion loss; out-of-band rejection; size 2.2 mum; thick n-type GaN filters; Acoustoelectric effects; Electrodes; Gallium nitride; Resonator filters;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium (FCS), 2010 IEEE International
Conference_Location
Newport Beach, CA
ISSN
1075-6787
Print_ISBN
978-1-4244-6399-2
Type
conf
DOI
10.1109/FREQ.2010.5556273
Filename
5556273
Link To Document