• DocumentCode
    1728866
  • Title

    Observation of the acoustoelectric effect in gallium nitride micromechanical bulk acoustic filters

  • Author

    Gokhale, Vikrant J. ; Shim, Yonghyun ; Rais-Zadeh, Mina

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2010
  • Firstpage
    524
  • Lastpage
    529
  • Abstract
    We report on the experimental verification of the acoustoelectric effect in gallium nitride (GaN) and present a model to describe this effect in GaN thickness-mode bulk acoustic filters. Filters are fabricated using 2.2 μm thick n-type GaN on high resistivity silicon epiwafers obtained from SOITEC. Acoustoelectric effect was observed by applying an electric field parallel to c-axis, the direction of acoustic wave propagation. Improvement in the insertion loss and out-of-band rejection was observed and Q amplifications exceeding 240% was achieved. Acoustoelectric effect makes it possible to dynamically tune the frequency response of GaN resonators and filters.
  • Keywords
    acoustic filters; acoustic resonators; acoustic wave propagation; acoustoelectric effects; bulk acoustic wave devices; frequency response; gallium compounds; micromechanical devices; GaN; GaN thickness-mode bulk acoustic filters; Q amplifications; SOITEC; acoustic wave propagation; acoustoelectric effect experimental verification; electric field; frequency response; gallium nitride micromechanical bulk acoustic filters; high resistivity silicon epiwafers; insertion loss; out-of-band rejection; size 2.2 mum; thick n-type GaN filters; Acoustoelectric effects; Electrodes; Gallium nitride; Resonator filters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium (FCS), 2010 IEEE International
  • Conference_Location
    Newport Beach, CA
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-4244-6399-2
  • Type

    conf

  • DOI
    10.1109/FREQ.2010.5556273
  • Filename
    5556273