DocumentCode :
1728989
Title :
Production of sheet electron beams with crossed-field secondary emission diodes
Author :
Saveliev, Y.M. ; Sibbett, W. ; Parkes, D.M.
Author_Institution :
Saint Andrews Univ., UK
fYear :
2001
Firstpage :
158
Abstract :
Summary form only given. Crossed-Field Secondary Emission (CFSE) diodes, which are based on a mechanism of self-sustained secondary electron emission, generate normally tubular electron beams with the current of up to several hundreds of Amperes for diode voltages of less than 40 kV (Saveliev et al., 1999). Linear current density of the output electron beam is in the range of 1-20 A/cm. A number of applications such as planar microwave devices (Agafonov et al., 1997) and large area plasma processing systems (Fernsler et al., 1999) do however require sheet electron beams rather than cylindrical beams. This work is concerned with a development of a CFSE planar diode that is capable of producing sheet electron beams. Several diode designs having cathode widths of 45-60 mm have been tested and characteristics of output electron beams were investigated. For diode voltages in the 25-40 kV range, the electron beams were generated with total currents of 15-40 A and linear current densities of 2-8A/cm depending on the diode voltage, magnetic field strength and the diode design. Due to the specific nature of the electron flow production in this CFSE diodes, two closely spaced electron sheets of /spl sim/1 mm thickness separated by 1-2 mm are produced. One of these can be easily suppressed, if desired, by the incorporation of a downstream reflecting electrode. A significant problem encountered in this research was the non-uniformity of the linear current density distribution j(x) along the diode width where the main contributory factor was found to be due to cathode edge effects. The influence of these edge effects has been reduced by an appropriate design of the cathode electrodes and, to date, a /spl plusmn/25% uniformity of the j(x) distribution has been achieved. Considerations relating to the further refinement of the electron beam characteristics and extension of-the beam width will be discussed.
Keywords :
electron beams; particle beam diagnostics; plasma diodes; secondary electron emission; 15 to 40 A; 40 kV; 45 to 60 mm; beam width; cathode edge effects; cathode electrodes; cathode widths; closely spaced electron sheets; crossed-field secondary emission diodes; diode design; diode voltages; diode width; electron beam characteristics; electron flow production; electron sheet thickness; large area plasma processing systems; linear current densities; linear current density; linear current density distribution; magnetic field strength; output electron beam; planar diode; planar microwave devices; self-sustained secondary electron emission mechanism; sheet electron beam production; tubular electron beams; Cathodes; Current density; Diodes; Electrodes; Electron beams; Electron emission; Microwave devices; Plasma applications; Production; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7141-0
Type :
conf
DOI :
10.1109/PPPS.2001.960721
Filename :
960721
Link To Document :
بازگشت