DocumentCode :
1729053
Title :
LiTaO3 ultrasonic transducer excited by lateral electric field
Author :
Zhang, Zhitian ; Ma, Tingfeng ; Zhang, Chao ; Wang, Wenyan ; Feng, Guanping
Author_Institution :
Dept. of Precision Instrum. & Mechanology, Tsinghua Univ., Beijing, China
fYear :
2010
Firstpage :
485
Lastpage :
488
Abstract :
Thickness extension mode excited by electric field across the thickness of piezoelectric substrate has long been used for various applications. In the present study, the properties of thickness extension mode excited by lateral electric field on LiTaO3 have been investigated using the extended Christoffel-Bechmann method. It is found that the Lateral field excitation (LFE) coupling factors for a-mode (quasi-extensional mode) reaches its maximum value of 17.4% on X-cut LiTaO3. The characteristics of an LFE device made of X-cut LiTaO3 have been investigated and the LFE device was used for the design of a high frequency ultrasonic transducer. The characteristic of the LiTaO3 LFE ultrasonic transducer was analyzed with the traditional KLM model and tested using traditional pulse/echo method. A LiTaO3 LFE ultrasonic with the center frequency of 33.18 MHz and the -6dB bandwidth of 29.99% was acquired, which was well in agreement with the results of the KLM model. Further analysis suggests that the LiTaO3 LFE device has great potential in the design of broadband high frequency ultrasonic transducers.
Keywords :
lithium compounds; tantalum compounds; ultrasonic transducers; KLM model; LiTaO3; LiTaO3 LFE ultrasonic transducer; broadband high frequency ultrasonic transducer design; extended Christoffel-Bechmann method; frequency 33.18 MHz; high frequency ultrasonic transducer; lateral electric field; lateral field excitation coupling factors; piezoelectric substrate thickness; pulse-echo method; thickness extension mode; Acoustics; Bandwidth; Couplings; Electric fields; Substrates; Transducers; Ultrasonic transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium (FCS), 2010 IEEE International
Conference_Location :
Newport Beach, CA
ISSN :
1075-6787
Print_ISBN :
978-1-4244-6399-2
Type :
conf
DOI :
10.1109/FREQ.2010.5556281
Filename :
5556281
Link To Document :
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