DocumentCode :
1729611
Title :
Octagonal MOSFET: Reliable device for low power analog applications
Author :
Joly, Y. ; Lopez, L. ; Portal, J.-M. ; Aziza, H. ; Masson, P. ; Ogier, J. -L ; Bert, Y. ; Julien, F. ; Fornara, P.
Author_Institution :
STMicroelectron., Rousset, France
fYear :
2011
Firstpage :
295
Lastpage :
298
Abstract :
Low power analog circuits needs large and short MOSFETs biased in the sub-threshold area with good performances in terms of matching. In order to reach these specifications, octagonal transistors are proposed. Due to their design, these transistors avoid hump effect. As a consequence, gate-source voltage matching under-threshold is always at its best level. Moreover, the paper shows the device robustness to hot carrier stress is improved on octagonal NMOS; VT matching degradation due to hot carrier stress is also improved with an octagonal design.
Keywords :
MOSFET; analogue integrated circuits; hot carriers; low-power electronics; device robustness; gate-source voltage matching; hot carrier stress; low power analog circuits; octagonal MOSFET; reliable device; sub-threshold area; Degradation; Human computer interaction; Logic gates; Reliability; Stress; Threshold voltage; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference (ESSDERC), 2011 Proceedings of the European
Conference_Location :
Helsinki
ISSN :
1930-8876
Print_ISBN :
978-1-4577-0707-0
Electronic_ISBN :
1930-8876
Type :
conf
DOI :
10.1109/ESSDERC.2011.6044176
Filename :
6044176
Link To Document :
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