• DocumentCode
    1729611
  • Title

    Octagonal MOSFET: Reliable device for low power analog applications

  • Author

    Joly, Y. ; Lopez, L. ; Portal, J.-M. ; Aziza, H. ; Masson, P. ; Ogier, J. -L ; Bert, Y. ; Julien, F. ; Fornara, P.

  • Author_Institution
    STMicroelectron., Rousset, France
  • fYear
    2011
  • Firstpage
    295
  • Lastpage
    298
  • Abstract
    Low power analog circuits needs large and short MOSFETs biased in the sub-threshold area with good performances in terms of matching. In order to reach these specifications, octagonal transistors are proposed. Due to their design, these transistors avoid hump effect. As a consequence, gate-source voltage matching under-threshold is always at its best level. Moreover, the paper shows the device robustness to hot carrier stress is improved on octagonal NMOS; VT matching degradation due to hot carrier stress is also improved with an octagonal design.
  • Keywords
    MOSFET; analogue integrated circuits; hot carriers; low-power electronics; device robustness; gate-source voltage matching; hot carrier stress; low power analog circuits; octagonal MOSFET; reliable device; sub-threshold area; Degradation; Human computer interaction; Logic gates; Reliability; Stress; Threshold voltage; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference (ESSDERC), 2011 Proceedings of the European
  • Conference_Location
    Helsinki
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4577-0707-0
  • Electronic_ISBN
    1930-8876
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2011.6044176
  • Filename
    6044176