DocumentCode :
1729624
Title :
Modeling of failure mechanisms for optimized MEMS CAD: design, fabrication and characterization of in situ test benches
Author :
Millet, O. ; Agache, V. ; Legrand, B. ; Collard, D. ; Buchaillot, L.
Author_Institution :
Inst. d´Electron. de Micro-electron. et de Nanotechnol., CNRS, Villeneuve d´Ascq, France
Volume :
2
fYear :
2003
Firstpage :
1578
Abstract :
This work considers the reliability of surface microfabricated structures and particularly the dynamic response of structural layers during operations, in order to develop a statistical modelling of failure mechanisms for micro-actuator. In situ test benches have been designed and fabricated allowing to applied elementary solicitations (traction, bending and torsion) to representative samples. Gold, in situ doped polysilicon and polysilicon doped by diffusion are used as structural layers. These devices are useful to study the fatigue phenomenon. Characterization and fatigue tests have been performed in a vacuum chamber under different environmental and stimuli conditions. Moreover, a theoretical analysis using Finite Elements Method has been achieved.
Keywords :
CAD; bending; diffusion; elemental semiconductors; failure analysis; fatigue; finite element analysis; gold; mechanical testing; microactuators; reliability; silicon; torsion; traction; MEMS CAD; Si:Au; bending; diffusion; elementary solicitations; failure mechanisms; fatigue tests; finite elements method; gold; microactuator; polysilicon; reliability; surface microfabricated structures; torsion; traction; Design automation; Design optimization; Fabrication; Failure analysis; Fatigue; Gold; Microactuators; Micromechanical devices; Performance evaluation; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7731-1
Type :
conf
DOI :
10.1109/SENSOR.2003.1217081
Filename :
1217081
Link To Document :
بازگشت