DocumentCode :
1729710
Title :
Mode shape measurement system with temperature variation function
Author :
Ishii, T. ; Watanabe, Y. ; Yano, Y. ; Goka, S. ; Sato, T. ; Sekimoto, H.
Author_Institution :
Grad. Sch. of Sci. & Eng., Tokyo Metropolitan Univ., Tokyo, Japan
fYear :
2010
Firstpage :
384
Lastpage :
387
Abstract :
A measurement system with a temperature control function was developed for mapping the vibration patterns of piezoelectric resonator devices. This system is based on the laser speckle method with intermittent device excitation. By use of a small oven with transparent windows, the vibration shapes of devices can be visualized in high temperature environment. Experimental results using a 5.6 MHz AT-cut quartz resonator show that the mode shapes can be visualized from room temperature to 74°C.
Keywords :
crystal resonators; shape measurement; temperature control; AT-cut quartz resonator; frequency 5.6 MHz; intermittent device excitation; laser speckle method; mode shape measurement system; piezoelectric resonator devices; temperature 74 degC; temperature control function; temperature variation function; vibration patterns; Measurement by laser beam; Optical imaging; Optical resonators; Resonant frequency; Shape; Temperature measurement; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium (FCS), 2010 IEEE International
Conference_Location :
Newport Beach, CA
ISSN :
1075-6787
Print_ISBN :
978-1-4244-6399-2
Type :
conf
DOI :
10.1109/FREQ.2010.5556305
Filename :
5556305
Link To Document :
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