DocumentCode :
1729991
Title :
GaN pitch-variable grating fabricated on Si substrate
Author :
Sameshima, H. ; Tanae, T. ; Hu, F. ; Hane, K.
Author_Institution :
Tohoku Univ., Sendai, Japan
fYear :
2010
Firstpage :
79
Lastpage :
80
Abstract :
A tunable grating is fabricated by micromachining a GaN crystal layer grown on Si substrate. The tunable grating consists of grating lines, electro-static comb-drive actuator and connection springs. The grating consists of 85nm wide, 12μm long 24 grating lines with 674nm period. The crystallization stress of an HfO2 layer deposited on the GaN crystal is used to compensate the residual stress of the GaN crystal grown on Si substrate. The freestanding GaN structure consisting of the grating and the actuator is fabricated by etching the Si substrate with XeF2 gas. Applying the voltage of 140V, the grating is expanded by 600nm corresponding to the period change of 3.7%.
Keywords :
III-V semiconductors; diffraction gratings; gallium compounds; hafnium compounds; integrated optics; internal stresses; micromachining; optical design techniques; optical fabrication; optical materials; optical tuning; silicon; wide band gap semiconductors; GaN; Si; XeF2; crystallization stress; electrostatic comb-drive actuator; etching; micromachining; pitch-variable grating; residual stress; voltage 140 V; Crystals; Etching; Gallium nitride; Gratings; Silicon; Substrates; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical MEMS and Nanophotonics (OPT MEMS), 2010 International Conference on
Conference_Location :
Sapporo
Print_ISBN :
978-1-4244-8926-8
Electronic_ISBN :
978-1-4244-8925-1
Type :
conf
DOI :
10.1109/OMEMS.2010.5672174
Filename :
5672174
Link To Document :
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